01 Jul 2026
Dr Scales Presents Research Poster at UK Semiconductors 2026 in Sheffield
Photograph of Dr Scales and poster.
Dr Scales attended and presented a research poster at UK Semiconductors 2026 conference in Sheffield (url).
The poster showcased some of her current work analysing defects in SiC for power electronics. Specifically, synchrotron XRT results from the B16 test beamline in 4H-SiC (Diamond Light Source, UK) and ECCI analysis in 3C-SiC (DCCEM, Oxford).
This work was in collaboration with University of Warwick's Shah Group, REWIRE-IKC, and University of Oxford's EMAM Group.
